- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
Patent holdings for IPC class G01N 21/95
Total number of patents in this class: 3537
10-year publication summary
312
|
306
|
283
|
335
|
336
|
372
|
388
|
357
|
310
|
114
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
KLA-Tencor Corporation | 2574 |
413 |
KLA Corporation | 1223 |
243 |
ASML Netherlands B.V. | 6816 |
155 |
Hitachi High-Tech Corporation | 4424 |
128 |
Samsung Electronics Co., Ltd. | 131630 |
99 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
77 |
Applied Materials Israel, Ltd. | 549 |
58 |
Tokyo Electron Limited | 11599 |
46 |
Applied Materials, Inc. | 16587 |
39 |
Nova Ltd. | 145 |
38 |
The Boeing Company | 19843 |
30 |
Onto Innovation Inc. | 340 |
30 |
Unity Semiconductor | 50 |
29 |
Screen Holdings Co., Ltd. | 2431 |
23 |
Camtek Ltd. | 103 |
22 |
NuFlare Technology, Inc. | 770 |
22 |
Seagate Technology LLC | 4228 |
20 |
Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
20 |
Samsung Display Co., Ltd. | 30585 |
19 |
Sumco Corporation | 1116 |
19 |
Other owners | 2007 |